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Characterization
u-GaN
n-GaN : Si
p-GaN : Mg
AlGaN
Average peak wavelength deviation ¡Â ¡¾ 3nm
....
Average peak wavelength deviation ¡Â ¡¾ 3nm
Blue emission
Wavelength Std. Dev ¡Â 3nm for Blue(470nm)
Green emission
Wavelength Std. Dev ¡Â 5nm for Green(510nm)
Al Mole Fraction ¡Ã 40% (Crack free surface morphology)
DCXRD
PL Mapping Data
PL Spectra
AFM Image
GaN on Si(111) Wafer
Crack free surface morphology
Surface Image on 2¡± Si Wafer
PL Mapping Data
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